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Microstructural characterization of metallic overlay coatings by high resolution analytical electron microscopy

✍ Scribed by M.M. Morra; R.R. Biederman; R.D. Sisson Jr.

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 961 KB
Volume: 119
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(84)90262-1

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