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Characterization of TiO2/SiO2 multilayers by high resolution transmission electron microscopy and electron energy loss spectroscopy

✍ Scribed by K. Yu-Zhang; G. Boisjolly; J. Rivory; L. Kilian; C. Colliex


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
479 KB
Volume
253
Category
Article
ISSN
0040-6090

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