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Nano-Scale Analytical Characterization of Engineering Materials by Transmission Electron Microscopy

✍ Scribed by T. Epicier; M.-C. Cheynet; J.-M. Martin

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 498 KB
Volume: 3
Category: Article
ISSN: 1438-1656
DOI: 10.1002/1527-2648(200108)3:8<612::aid-adem612>3.0.co;2-1

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