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Characterization of the microstructure of sintered AIN by transmission electron microscopy

✍ Scribed by M.F. Denanot; J. Rabier


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
407 KB
Volume
109
Category
Article
ISSN
0921-5093

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✦ Synopsis


Aluminium nitride samples sintered with various Y20: concentrations are characterized by transmission electron microscopy. Topology and second phase characteristics at grain boundaries are investigated by X-ray and diffraction experiments. At low Y:O~ concentrations (up to 10%) second phases (mainly Y3AlsOt2 ) are located at pockets found at the function of several grains whereas for high Y20~ concentrations (20%) second phases are different and usually surround the AIN grains. Dislocations and planar defects are also found in AIN grains. The geometrical features and contrast analysis of these planar defects are explained by the incorporation of oxygen in the AlN matrix.


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