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The microstructure of ultrahard material compacts studied by transmission electron microscopy

โœ Scribed by J.C. Walmsley


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
641 KB
Volume
105-106
Category
Article
ISSN
0921-5093

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โœ M.F. Denanot; J. Rabier ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 407 KB

Aluminium nitride samples sintered with various Y20: concentrations are characterized by transmission electron microscopy. Topology and second phase characteristics at grain boundaries are investigated by X-ray and diffraction experiments. At low Y:O~ concentrations (up to 10%) second phases (mainly