✦ LIBER ✦
Microstructural characterization of the tool–chip interface enabled by focused ion beam and analytical electron microscopy
✍ Scribed by A. Flink; R. M'Saoubi; F. Giuliani; J. Sjölén; T. Larsson; P.O.Å. Persson; M.P. Johansson; L. Hultman
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 788 KB
- Volume
- 266
- Category
- Article
- ISSN
- 0043-1648
No coin nor oath required. For personal study only.