𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of material anisotropy using microwave ellipsometry

✍ Scribed by F. Gambou; B. Bayard; G. Noyel


Book ID
102519597
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
162 KB
Volume
53
Category
Article
ISSN
0895-2477

No coin nor oath required. For personal study only.

✦ Synopsis


Abstract

The aim of this article is to propose an original low‐cost new experimental technique for the characterization of anisotropic media.This technique is based on free‐space transmission ellipsometry at microwave frequency (30 GHz). This method allows to obtain the electromagnetic anisotropy in a material through the measurement of microwave polarization states. Β© 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26201


πŸ“œ SIMILAR VOLUMES


Spectroscopic ellipsometry characterizat
✍ J. Vanhellemont; H.E. Maes πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 570 KB

The wide applicability of spectroscopic ellipsometry (S/z) to characterize non-destructively silicon-on-insulator materials is illustrated with a number of case studies. SE allows the determination of not only the optical properties of single layers as a fimction of the wavelength but also their thi