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Characterization of an individual grain boundary in metal-induced laterally crystallized polycrystalline silicon thin-film devices

✍ Scribed by Mingxiang Wang; Man Wong

Book ID: 114538774
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 144 KB
Volume: 48
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.936584

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