✦ LIBER ✦

Characterization and depth profiles measurements of silicon nitride thin films on silicon and molybdenum substrates by Auger electron spectroscopy

✍ Scribed by Chakib Fakih; Glades Bachir Fakih; Ali Kaafarani; M. Zoaeter; René Sylvain Bes; René Berjoan

No coin nor oath required. For personal study only.

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