𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of as-grown and iodinated Bi2S3 thin films on silicon and quartz substrates by XRD

✍ Scribed by Nayak, B. B. ;Singh, S. K. ;Acharya, B. S.


Book ID
105380361
Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
296 KB
Volume
105
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Characterization of silicon carbide thin
✍ P. Zanola; E. Bontempi; C. Ricciardi; G. Barucca; L.E. Depero πŸ“‚ Article πŸ“… 2004 πŸ› Elsevier Science 🌐 English βš– 227 KB

Due to its outstanding electrical and mechanical properties, silicon carbide (SiC) is considered a leading semiconducting material for high temperature sensors. Since the piezoresistive effect in SiC is highly anisotropic and exhibits a dependence on the crystal orientation, the role of the substra