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Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures

✍ Scribed by Brammertz, Guy; Martens, Koen; Sioncke, Sonja; Delabie, Annelies; Caymax, Matty; Meuris, Marc; Heyns, Marc

No coin nor oath required. For personal study only.

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