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The exact low-frequency capacitance-voltage characteristics of metal-oxide-semiconductor (MOS) and semiconductor-insulator-semiconductor (SIS) structures

✍ Scribed by Temple, V.A.K.; Shewchun, J.


Book ID
114590057
Publisher
IEEE
Year
1971
Tongue
English
Weight
659 KB
Volume
18
Category
Article
ISSN
0018-9383

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