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Determining electrophysical characteristics of metal-oxide-semiconductor structures from the data of voltage-capacitance analysis of the depletion region of a semiconductor surface

โœ Scribed by G. V. Chucheva; R. D. Tikhonov; A. G. Zhdan; V. G. Naryshkina


Book ID
110167605
Publisher
Springer
Year
2008
Tongue
English
Weight
180 KB
Volume
51
Category
Article
ISSN
0020-4412

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