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Capacitance–voltage characterization of surface-treated Al2O3/GaN metal–oxide–semiconductor structures

✍ Scribed by Bae, Sung-Bum; Kim, Ki-Won; Lee, Yong Soo; Lee, Jung-Hee; Bae, Youngho; Cristoloveanu, Sorin

Book ID: 123304366
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 595 KB
Volume: 109
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2013.03.108

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