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Characterisation of low temperature poly-Si thin film transistors

โœ Scribed by S.D. Brotherton; J.R. Ayres; N.D. Young


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
729 KB
Volume
34
Category
Article
ISSN
0038-1101

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Stacked gate insulator of photooxide and
โœ Yukihiko Nakata; Tetsuya Okamoto; Takashi Itoga; Toshimasa Hamada; Yutaka Ishii ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 1019 KB

A stacked gate insulator consisting of photooxide and PECVD film prepared from SiH 4 and N 2 O for use in low-temperature poly-Si thin-film transistors has been developed. The rate of photooxidation using a Xe excimer lamp is the same for (100) and (111) single-crystal Si wafers, and SiO 2 with good