Fabrication of a poly-Si thin-film transistor with storage capacitor
✍ Scribed by A Mimura; E Kimura; T Suzuki; K Ono; J.-I Ohwada; N Konishi; K Miyata
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 869 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0141-9382
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## Abstract An analysis of an amorphous silicon (a–Si) thin‐film‐transistor liquid‐crystal display (TFT–LCD) pixel is presented. The electro‐optical model combines the electrical properties of the switching element and the optical performance of a twisted nematic (TN) liquid‐crystal cell. © 2001 Jo
A stacked gate insulator consisting of photooxide and PECVD film prepared from SiH 4 and N 2 O for use in low-temperature poly-Si thin-film transistors has been developed. The rate of photooxidation using a Xe excimer lamp is the same for (100) and (111) single-crystal Si wafers, and SiO 2 with good