Capture Cross Section of Traps Causing Random Telegraph Noise in Gate-Induced Drain Leakage Current

✍ Scribed by Yoo, Sung-Won; Son, Younghwan; Shin, Hyungcheol

• Book ID: 124089905
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 676 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/TED.2013.2239299