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Calculation of residual thermal stress in GaN epitaxial layers grown on technologically important substrates

✍ Scribed by K. Barghout; J. Chaudhuri

Book ID: 111590770
Publisher: Springer
Year: 2004
Tongue: English
Weight: 302 KB
Volume: 39
Category: Article
ISSN: 0022-2461
DOI: 10.1023/b:jmsc.0000040094.33095.6f

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