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Partial strain relaxation via misfit dislocation generation at heterointerfaces in (Al,In)GaN epitaxial layers grown on semipolar (1122) GaN free standing substrates

✍ Scribed by Tyagi, Anurag; Wu, Feng; Young, Erin C.; Chakraborty, Arpan; Ohta, Hiroaki; Bhat, Rajaram; Fujito, Kenji; DenBaars, Steven P.; Nakamura, Shuji; Speck, James S.


Book ID
124089792
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
510 KB
Volume
95
Category
Article
ISSN
0003-6951

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