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Dependence of the stress–temperature coefficient on dislocation density in epitaxial GaN grown on α-Al2O3 and 6H–SiC substrates

✍ Scribed by Ahmad, I.; Holtz, M.; Faleev, N. N.; Temkin, H.


Book ID
118067489
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
352 KB
Volume
95
Category
Article
ISSN
0021-8979

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