## ลฝ . Formation of a buried oxide BOX layer during high-temperature annealing in a separation by implanted oxygen ลฝ . ลฝ . SIMOX process was evaluated by means of Fourier-transform infrared FTIR absorption spectroscopy. The evaluation results suggested that the formation process could be controlle
โฆ LIBER โฆ
Buried oxide layers formed by low dose SIMOX processes
โ Scribed by B. Aspar; C. Guilhalmenc; C. Pudda; A. Garcia; A.M. Papon; A.J. Auberton-Herve; J.M. Lamure
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 391 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0167-9317
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