๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Bright visible photoluminescence in thin silicon films

โœ Scribed by T.P. Pearsall; Jeff C. Adams; J.N. Kidder Jr.; P.S. Williams; S.A. Chambers; John Lach; D.T. Schwartz; Brett Z. Nosho


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
425 KB
Volume
222
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Raman scattering and room-temperature vi
โœ Wang, Yinyue; Gong, Hengxiang; Yang, Yinhu; Guo, Yongping; Gan, Runjin ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 132 KB ๐Ÿ‘ 2 views

Silicon nanocrystals (nc-Si) embedded in SiO 2 glassy mixture have been prepared on glass substrates and silicon and germanium wafers by r.f. co-sputtering and post-annealing in a vacuum. Using Raman spectrometry, photoluminescence and electrical conductivity measurements, we have investigated the s

Enhancing photoluminescence of nanocryst
โœ Chun-Yu Lin; Yean-Kuen Fang; Shih-Fang Chen; Shiuan-Ho Chang; Tse-Heng Chou ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 638 KB

The authors report the photoluminescence (PL) property of nanocrystalline silicon (nc-Si) enhanced by oxygen plasma oxidation technology. The oxidized nanocrystalline silicon thin films were investigated by PL, transmission electron microscope (TEM), micro-Raman scattering and X-ray diffraction (XRD