The correlation of radiation damage recovery with crystallographic orientation in magnesium oxide (MgO) single crystals during isochronal post-implantation annealing was investigated. Samples of (1 0 0), (1 1 0) and (1 1 1) MgO were implanted with 100 keV Ar + ions at room temperature and annealed i
Blistering effects of low energy hydrogen and helium ions implanted in GaAs(1 0 0) crystals
✍ Scribed by A. Giguère; N. Desrosiers; B. Terreault
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 162 KB
- Volume
- 242
- Category
- Article
- ISSN
- 0168-583X
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