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Automatic Test Pattern Generation for Resistive Bridging Faults

✍ Scribed by Piet Engelke; Ilia Polian; Michel Renovell; Bernd Becker

Publisher
Springer US
Year
2006
Tongue
English
Weight
509 KB
Volume
22
Category
Article
ISSN
0923-8174

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## Abstract As a technique for complementing the long testing time, which is a shortcoming of pseudo‐random pattern test, we will propose a BIST‐oriented test pattern generator (TPG) which achieves high fault detection efficiency with a short testing time for transition faults. The proposed TPG is