𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Auger depth profiling of thick insulating films by angle lapping. (USA)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
168 KB
Volume
28
Category
Article
ISSN
0042-207X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Improved depth resolution in Auger depth
✍ W. Pamler; E. Wildenauer; A. Mitwalsky πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 662 KB

## Abstract The depth resolution in Auger in‐depth profiles of TiN thin films on smooth Si substrates is determined by the evolution of a sputter‐induced surface roughness. It is shown that this effect depends critically on the ion angle of incidence. Therefore, the depth resolution can be improved

In-depth composition profile of anodic o
✍ S. Matsuzawa; N. Baba; S. Tajima πŸ“‚ Article πŸ“… 1979 πŸ› Elsevier Science 🌐 English βš– 286 KB

In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.