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Atomistic simulation of Si/SiO2 interfaces

✍ Scribed by R.M. Van Ginhoven; H.P. Hjalmarson

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 578 KB
Volume: 255
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2006.11.022

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