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RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS

✍ Scribed by Michał Ćwil; Piotr Konarski; Michał Pająk; Tomasz Bieniek; Andrzej Kosiński; Krzysztof Kaczorek

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 350 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.02.215

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