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Atomic Resolution Images of Solid-Liquid Interfaces

โœ Scribed by Brian Giambattista, W. W. McNairy, C. G. Slough, A. Johnson, L. D. Bell, R. V. Coleman, J. Schneir, R. Sonnenfeld, B. Drake and P. K. Hansma


Book ID
123634682
Publisher
National Academy of Sciences
Year
1987
Tongue
English
Weight
1021 KB
Volume
84
Category
Article
ISSN
0027-8424

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๐Ÿ“œ SIMILAR VOLUMES


Atomic force microscopy of local complia
โœ S.J. O'Shea; M.E. Welland; J.B. Pethica ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 496 KB

A modified atomic force microscope ( AFM ) is used to directly measure the local compliance of ordered liquid layers at solidliquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We