A modified atomic force microscope ( AFM ) is used to directly measure the local compliance of ordered liquid layers at solidliquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We
Equilibrium atomic roughness at solid-liquid interfaces of pure metals
β Scribed by A. Passerone; N. Eustathopoulos; J.C. Joud; P. Desre
- Publisher
- Elsevier Science
- Year
- 1976
- Weight
- 408 KB
- Volume
- 1
- Category
- Article
- ISSN
- 0390-6035
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