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Atomic force microscopy of local compliance at solid—liquid interfaces

✍ Scribed by S.J. O'Shea; M.E. Welland; J.B. Pethica

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
496 KB
Volume
223
Category
Article
ISSN
0009-2614

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✦ Synopsis

A modified atomic force microscope ( AFM ) is used to directly measure the local compliance of ordered liquid layers at solidliquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We show that reasonable correlation decay lengths, molecular sixes, and material rigidities can be determined. The new method is based on a force modulation technique and can be more sensitive to weak longer range interactions compared with the more direct measurement of forces using the static deflection of the AFM cantilever.

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