Damping near Solid−Liquid Interfaces Measured with Atomic Force Microscopy
✍ Scribed by O'Shea, S. J.; Lantz, M. A.; Tokumoto, H.
- Book ID
- 126503894
- Publisher
- American Chemical Society
- Year
- 1999
- Tongue
- English
- Weight
- 121 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0743-7463
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📜 SIMILAR VOLUMES
A modified atomic force microscope ( AFM ) is used to directly measure the local compliance of ordered liquid layers at solidliquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We
## Abstract In any polymer blend system, the nature and thickness of the polymer interface can have a significant influence on the overall performance of the blend. Consequently, it is important to understand the nature of the interactions between the various blend components to effectively design