A modified atomic force microscope ( AFM ) is used to directly measure the local compliance of ordered liquid layers at solidliquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We
✦ LIBER ✦
Atomic Force Microscopy at Solid−Liquid Interfaces
✍ Scribed by O'Shea, S. J.; Welland, M. E.
- Book ID
- 111863537
- Publisher
- American Chemical Society
- Year
- 1998
- Tongue
- English
- Weight
- 237 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0743-7463
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