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Assessment of testing methodologies for thin-film vacuum MEMS packages

โœ Scribed by Qian Li; Hans Goosen; Fred van Keulen; Joost van Beek; Guoqi Zhang


Book ID
106185542
Publisher
Springer-Verlag
Year
2008
Tongue
English
Weight
429 KB
Volume
15
Category
Article
ISSN
0946-7076

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