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The use of X-ray diffraction rocking curve methodology for assessment of the c-axis orientation in BiSrCaCuO superconducting thin films

✍ Scribed by T.N. Blanton; M. Lelental; C.L. Barnes


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
825 KB
Volume
184
Category
Article
ISSN
0921-4534

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