Modifications test of vacuum deposition Ni/Cr films with Mn and Si for thin film resistors

✍ Scribed by Doz. Dr. sc. E. Schippel

• Publisher: John Wiley and Sons
• Year: 1980
• Tongue: English
• Weight: 192 KB
• Volume: 15
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.19800150808