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Anomalous hot carrier degradation of nMOSFET's at elevated temperatures

โœ Scribed by Hyunsang Hwang; Jung-suk Goo; Hoyup Kwon; Hyungsoon Shin


Book ID
126740028
Publisher
IEEE
Year
1995
Tongue
English
Weight
237 KB
Volume
16
Category
Article
ISSN
0741-3106

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