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Hot carrier degradation of InGaZnO thin film transistors under light illumination at the elevated temperature

✍ Scribed by Sueng Min Lee; Chong Gun Yu; Won-Ju Cho; Jong Tae Park


Book ID
113916141
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
790 KB
Volume
72
Category
Article
ISSN
0038-1101

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