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Hot-carrier degradation in LDD-MOSFETs at high temperatures

โœ Scribed by Cemal T. Dikmen; Numan S. Dogan; Mohamed Osman; Arup Bhattacharyya


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
217 KB
Volume
37
Category
Article
ISSN
0038-1101

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