Annealing-induced amorphization in a spu
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Jinn P. Chu; Chiu-Yen Wang; L.J. Chen; Qi Chen
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Article
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2011
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Elsevier Science
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English
β 842 KB
The annealing-induced amorphization of a sputtered glass-forming Cu 51 Zr 42 Al 4 Ti 3 thin film has been clarified by in-situ transmission electron microscopy in conjunction with ex-situ atomic force microscopy and X-ray diffractometry. Upon heating of the film at low temperatures, nanocrystallizat