Deep level defects in both p + /n junctions and n-type Schottky GaN diodes are studied using the Fourier transform deep level transient spectroscopy. An electron trap level was detected in the range of energies at E c Γ E t ΒΌ 0:2320:27 eV with a capture cross-section of the order of 10 Γ19 -10 Γ16 c
β¦ LIBER β¦
Annealing behaviour of electrically active point defects in gamma-irradiated n-GaN films
β Scribed by V.V Emtsev; V.Yu Davydov; V.V Lundin; D.S Poloskin; J Aderhold; H Klausing; D Mistele; T Rotter; J Stemmer; F Fedler; O Semchinova; J Graul
- Book ID
- 118532166
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 202 KB
- Volume
- 210
- Category
- Article
- ISSN
- 0022-0248
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