✦ LIBER ✦
Electrically active defects in erbium-implanted silicon: Effects of annealing under high hydrostatic pressures and electron irradiation
✍ Scribed by V.V. Emtsev; V.V. Emtsev Jr.; V.V. Kozlovskii; A. Misiuk; G.A. Oganesyan; D.S. Poloskin; N.A. Sobolev; E.A. Tropp
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 136 KB
- Volume
- 159-160
- Category
- Article
- ISSN
- 0921-5107
No coin nor oath required. For personal study only.