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Annealing behavior of silicon nitride and silicon oxynitride films prepared by ECR plasma CVD method

✍ Scribed by Takeshi Kamada; Takashi Hirao; Masatoshi Kitagawa; Kentaro Setsune; Kiyotaka Wasa; Tomio Izumi


Book ID
107925685
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
262 KB
Volume
33-34
Category
Article
ISSN
0169-4332

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