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Analysis of the ohmic contacts of Ti/Al/Ni/Au to AlGaN/GaN HEMTs by the multi-step annealing process

✍ Scribed by Yan, Wei; Zhang, Renping; Du, Yandong; Han, Weihua; Yang, Fuhua


Book ID
118190633
Publisher
IOP Publishing
Year
2012
Tongue
English
Weight
387 KB
Volume
33
Category
Article
ISSN
1674-4926

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