Analysis on the new mechanisms of low resistance stacked Ti/Al Ohmic contact structure on AlGaN/GaN HEMTs

✍ Scribed by Gong, Rumin; Wang, Jinyan; Dong, Zhihua; Liu, Shenghou; Yu, Min; Wen, Cheng P; Hao, Yilong; Shen, Bo; Cai, Yong; Zhang, Baoshun; Zhang, Jincheng

• Book ID: 119950366
• Publisher: Institute of Physics
• Year: 2010
• Tongue: English
• Weight: 920 KB
• Volume: 43
• Category: Article
• ISSN: 0022-3727
• DOI: 10.1088/0022-3727/43/39/395102