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The role of barrier layer on Ohmic performance of Ti∕Al-based contact metallizations on AlGaN∕GaN heterostructures

✍ Scribed by Mohammed, Fitih M.; Wang, Liang; Adesida, Ilesanmi; Piner, Eddie


Book ID
120449014
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
724 KB
Volume
100
Category
Article
ISSN
0021-8979

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