Transmission electron microscopy assessment of the Si enhancement of Ti∕Al∕Ni∕Au Ohmic contacts to undoped AlGaN∕GaN heterostructures

✍ Scribed by Desmaris, Vincent; Shiu, Jin-Yu; Lu, Chung-Yu; Rorsman, Niklas; Zirath, Herbert; Chang, Edward-Yi

• Book ID: 120004197
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 999 KB
• Volume: 100
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.2218262