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Low resistance ohmic contacts on AlGaN/GaN structures using implantation and the “advancing” Al/Ti metallization

✍ Scribed by Qiao, D.; Guan, Z. F.; Carlton, J.; Lau, S. S.; Sullivan, G. J.


Book ID
121231270
Publisher
American Institute of Physics
Year
1999
Tongue
English
Weight
404 KB
Volume
74
Category
Article
ISSN
0003-6951

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