✦ LIBER ✦
Correlation between microstructure and temperature dependent electrical behavior of annealed Ti/Al/Ni/Au Ohmic contacts to AlGaN/GaN heterostructures
✍ Scribed by Iucolano, Ferdinando; Greco, Giuseppe; Roccaforte, Fabrizio
- Book ID
- 126921485
- Publisher
- American Institute of Physics
- Year
- 2013
- Tongue
- English
- Weight
- 812 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0003-6951
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