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Role of Ti/Al relative thickness in the formation mechanism of Ti/Al/Ni/Au Ohmic contacts to AlGaN/GaN heterostructures

✍ Scribed by Kong, Xin; Wei, Ke; Liu, Guoguo; Liu, Xinyu


Book ID
118011690
Publisher
Institute of Physics
Year
2012
Tongue
English
Weight
974 KB
Volume
45
Category
Article
ISSN
0022-3727

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