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Analysis of the field effect in a metal-oxide-small-grain polysilicon structure-experimentation and modeling

✍ Scribed by Lhermite, H.; Bonnaud, O.; Colin, Y.; Rouffet, A.M.

Book ID: 114535496
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 882 KB
Volume: 35
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.2512

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